Cryo-electron Microscopy Specimen Preparation (Focused Ion Beam)

Watch the Full Video at https://www.jove.com/v/51463/cryo-ele.... Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam - a 2 minute Preview of the Experimental Protocol Stefano Rubino, Petter Melin, Paul Spellward, Klaus Leifer Uppsala University, Department of Engineering Sciences; Gatan Inc.,; Swedish University of Agricultural Sciences, Department of Microbiology; University of Oslo, Physics Department; Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM. Visit https://www.jove.com?utm_source=youtu... to explore our entire library of 14,000+ videos of laboratory methods and science concepts. JoVE is the world-leading producer and provider of science videos with the mission to improve scientific research and education. Millions of scientists, educators, and students at 1500+ institutions worldwide, including schools like Harvard, MIT and Stanford benefit from using JoVE's extensive library of 14,000+ videos in their research,education and teaching. Subscribe to our channel:    / jovejournalofvisualizedexperiments